Total dose testing of a cmos charged particle spectrometer

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 1957-1964

  Hancock, B R ^a   Soli, G A ^b,c  

^a IEEE   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c Scientific Imaging Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DOSIMETRY; ELECTRONS; MICROPROCESSOR CHIPS; PROTONS; RADIATION EFFECTS; SENSORS; SPACE FLIGHT; SPACE SURVEILLANCE;

ACTIVE PIXEL TECHNOLOGY; CHARGED PARTICLE SPECTROMETERS; TOTAL DOSE TESTING;

PARTICLE SPECTROMETERS;

EID: 0031341054     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658968     Document Type: Article

References (11)

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