Composition dependent bilayer atomic ordering in Al xGa 1-xN films examined by polarization-dependent extended x-ray absorption fine structure

Applied Physics Letters

Volumn 100, Issue 16, 2012, Pages

  Woicik, J C ^a   Ludwig, K F ^b   Moustakas, T D ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Boston University   (United States)

^c Boston University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC ORDERING; BI-LAYER; CATION ORDERING; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; LOCAL ORDER; LOCAL STRUCTURE; NEAREST-NEIGHBORS; THEORETICAL PREDICTION; VIRTUAL CRYSTAL APPROXIMATION;

ABSORPTION SPECTRA; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; METALLIC FILMS;

GALLIUM;

EID: 84859984310     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4704678     Document Type: Article

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