Extended x-ray absorption fine structure study of AlxGa(1-x)N films

Applied Physics Letters

Volumn 70, Issue 16, 1997, Pages 2108-2110

  Miyano, K E ^a,b   Woicik, J C ^c   Robins, Lawrence H ^c   Bouldin, C E ^c   Wickenden, D K ^d  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b CITY UNIVERSITY OF NEW YORK   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000949529     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118963     Document Type: Article

References (11)

1. See, e.g., H. Morkoç and S. N. Mohammad, Science 267, 51 (1995).
2. D. K. Wickenden, W. A. Bryden, T. J. Kistenmacher, P. F. Bythrow, and K. Strohbehn, Johns Hopkins APL Technical Digest 16, 246 (1995).
3. See, e.g., X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS, and XANES, edited by D. C. Koningsberger and R. Prins (Wiley, New York, 1988).
4. J. C. Mikkelsen and J. B. Boyce, Phys. Rev. B 28, 7130 (1983).
5. A. E. Wickenden, D. K. Wickenden, and T. J. Kistenmacher, J. Appl. Phys. 75, 5367 (1994).
6. Numerical Data and Functional Relationships in Science and Technology, edited by O. Madelung (Springer, Berlin, 1982), Vol. 17a.
7. Y. Koide, H. Itoh, N. Sawaki, I. Akasaki, and M. Hashimoto, J. Electrochem. Soc. 133, 1956 (1986).
8. S. Yoshida, S. Misawa, and S. Gonda, J. Appl. Phys. 53, 6844 (1982).
9. H. Schultz and K. H. Thiemann, Solid State Commun. 23, 813 (1977).
10. J. Mustre de Leon, J. J. Rehr, S. I. Zabinsky, and R. C. Albers, Phys. Rev. B 44, 4146 (1991).
11. In using a single-scattering calculation, we neglected two principal multiple-scattering paths. The first involves the nearest-neighbor N and a second-neighbor cation, but here one scattering involves low-Z N and a scattering angle near the 90° minimum. The other multiple-scattering path involves two low-Z nearest-neighbor N atoms.