An X-ray and TEM study of inhomogeneous ordering in AlxGa 1-xN layers grown by MOCVD

Journal of Physics and Chemistry of Solids

Volumn 64, Issue 9-10, 2003, Pages 1653-1656

  Laugt M ^a   Bellet Amalric, E ^b   Ruterana, P ^c   Omnes F ^a  

^a CRHEA CNRS   (France)

^b CEA GRENOBLE   (France)

^c LERMAT Laboratoire d'Etude et de Recherche sur les Materiaux   (France)

Author keywords

C. X ray diffraction

Indexed keywords

METALLORGANIC CHEMICAL VAPOR DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY; VAPOR PHASE EPITAXY; X RAY DIFFRACTION ANALYSIS;

DISORDERED ALLOYS;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 0042236866     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(03)00167-7     Document Type: Conference Paper

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