Analysis of composition fluctuations on an atomic scale in Al0.25Ga0.75N by high-resolution transmission electron microscopy

Applied Physics Letters

Volumn 73, Issue 7, 1998, Pages 930-932

  Neubauer, B ^a   Rosenauer, A ^a   Gerthsen, D ^a   Ambacher, O ^b   Stutzmann, M ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000377942     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122041     Document Type: Article

References (11)

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