Step contrast in low energy electron microscopy

Ultramicroscopy

Volumn 74, Issue 4, 1998, Pages 237-246

  Chung, W F ^a   Altman, M S ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Image simulation; Low energy electron microscopy (LEEM); Step phase contrast; Surface step

Indexed keywords

COHERENT LIGHT; CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE DIFFRACTION; MATHEMATICAL MODELS; MOLYBDENUM; OPTICAL RESOLVING POWER; SILICON; SURFACE STRUCTURE; TUNGSTEN;

LOW ENERGY ELECTRON MICROSCOPY (LEEM); STEP-PHASE CONTRAST; WAVE-OPTICAL MODEL;

ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; IMAGE PROCESSING; LOW ENERGY RADIATION; MATHEMATICAL ANALYSIS; OPTICS;

EID: 0032170401     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00043-6     Document Type: Article

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