Trends in low energy electron microscopy

Journal of Physics Condensed Matter

Volumn 22, Issue 8, 2010, Pages

  Altman, M S ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CONTRAST MECHANISM; CURRENT CAPABILITY; DYNAMIC PROCESS; IMAGING PRINCIPLE; IN-SITU TECHNIQUES; LOW ENERGY ELECTRON MICROSCOPY; REALTIME IMAGING; SPATIAL AND TEMPORAL RESOLUTIONS;

ELECTRON MICROSCOPY;

ELECTRON MICROSCOPES;

EID: 77953643760     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/8/084017     Document Type: Review

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