|
Volumn 258, Issue 15, 2012, Pages 5605-5609
|
Characterization of SiC in DLC/a-Si films prepared by pulsed filtered cathodic arc using Raman spectroscopy and XPS
|
Author keywords
Amorphous silicon; Diamond like carbon; Pulsed filtered cathodic arc; Silicon carbide
|
Indexed keywords
AMORPHOUS CARBON;
BINDING ENERGY;
SILICON CARBIDE;
SUBSTRATES;
X RAY PHOTOELECTRON SPECTROSCOPY;
CATHODIC ARC;
DC MAGNETRON SPUTTERING;
DEPTH-PROFILE ANALYSIS;
DIAMOND LIKE CARBON;
GERMANIUM SUBSTRATES;
IN-SITU ELLIPSOMETRY;
PRECISE CONTROL;
SIC FORMATION;
AMORPHOUS SILICON;
|
EID: 84859159435
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2012.02.036 Document Type: Article |
Times cited : (25)
|
References (39)
|