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Volumn 77, Issue 1, 2003, Pages 27-38

High-dose carbon implantations into silicon: Fundamental studies for new technological tricks

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; AMORPHOUS MATERIALS; ANNEALING; CARBON; CRYSTALLINE MATERIALS; INSULATING MATERIALS; INTERFACIAL ENERGY; MICROELECTROMECHANICAL DEVICES; PRECIPITATION (CHEMICAL); SILICON CARBIDE; THERMAL EFFECTS;

EID: 0037532569     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-2062-8     Document Type: Article
Times cited : (29)

References (88)
  • 10
    • 0003858449 scopus 로고    scopus 로고
    • Y.S. Park (Ed.); (Academic Press, San Diego)
    • Y.S. Park (Ed.): SiC Materials and Devices (Academic Press, San Diego, 1998)
    • (1998) SiC Materials and Devices
  • 43
    • 0004937090 scopus 로고    scopus 로고
    • Ion beam processing of single crystalline silicon carbide
    • (Eur. Mater. Res. Soc. Symp. Proc. 65, Part 1), ed. by F. Priolo, J.K.N. Lindner, A. Nylandsted Larsen, J.M. Poate (Elsevier, Amsterdam)
    • W. Skorupa, V. Heera, Y. Pacaud, H. Weishart: 'Ion beam processing of single crystalline silicon carbide.' In New Trends in Ion Beam Processing of Materials (Eur. Mater. Res. Soc. Symp. Proc. 65, Part 1), ed. by F. Priolo, J.K.N. Lindner, A. Nylandsted Larsen, J.M. Poate (Elsevier, Amsterdam 1997) p. 114
    • (1997) New Trends in Ion Beam Processing of Materials , pp. 114
    • Skorupa, W.1    Heera, V.2    Pacaud, Y.3    Weishart, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.