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Applied Surface Science

Volumn 257, Issue 7, 2011, Pages 2665-2668

Chemical and morphological difference between TiN/DLC and a-C:H/DLC grown by pulsed vacuum arc techniques

(3) Castillo, H A a Restrepo Parra, E a Arango Arango, P J a

a UNIVERSIDAD NACIONAL DE COLOMBIA (Colombia)

Author keywords

a C DLC; Adherence; Morphology; Pulsed arc; TiN DLC; XPS

Indexed keywords

AMORPHOUS CARBON; AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CARBON FILMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MIXTURES; MORPHOLOGY; TIN; TITANIUM NITRIDE; VACUUM APPLICATIONS; VACUUM TECHNOLOGY;

A-C/DLC; ADHERENCE; AMORPHOUS HYDROGENATED CARBON (A-C:H); FOURIER TRANSFORM INFRA RED (FTIR) SPECTROSCOPY; LATERAL FORCE MICROSCOPY; MORPHOLOGIC CHARACTERISTICS; PULSED ARC; SCANNING PROBE MICROSCOPY TECHNIQUES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79251593238 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2010.10.039 Document Type: Article

Times cited : (34)

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