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Volumn 285, Issue 1-2 Complete, 1999, Pages 255-259

Characterization of Si3N4/SiC nanocomposite by Raman scattering and XPS

(7) Cho, Woo Seok a Oh, Yoon Suk a Kim, Chang Sam a Osada, Minoru a Kakihana, Masato a Lim, Dae Soon a Cheong, Deock Soo a

a Korea Institute of Science and Technology (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; GRAIN BOUNDARIES; MECHANICAL PROPERTIES; POLYMERS; PYROLYSIS; RAMAN SCATTERING; SILICON CARBIDE; SILICON NITRIDE; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

IMPURITY PHASE; NANOPARTICLES;

NANOSTRUCTURED MATERIALS;

EID: 0033099132 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-8388(99)00007-9 Document Type: Article

Times cited : (52)

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