Recent developments in dynamic transmission electron microscopy

Current Opinion in Solid State and Materials Science

Volumn 16, Issue 1, 2012, Pages 23-30

  Browning, N D ^a,b,c   Bonds, M A ^a   Campbell, G H ^c   Evans, J E ^b   Lagrange, T ^c   Jungjohann, K L ^a   Masiel, D J ^a   McKeown, J ^c   Mehraeen, S ^b   Reed, B W ^c   Santala, M ^c  

^a University of California Davis   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Dark field imaging; Dynamic TEM; Gas stages; In situ microscopy; Liquid stages

Indexed keywords

BEAM CURRENTS; DARK FIELD IMAGING; DETECTION SCHEME; DRIVING FORCES; DYNAMIC TRANSMISSION ELECTRON MICROSCOPIES; ELECTRON PULSE; EXTREME CONDITIONS; FIELD-EMISSION TEM; HIGH RESOLUTION IMAGE; HIGH-TIME RESOLUTION; IN SITU MICROSCOPY; IN-SITU; INSTRUMENT DEVELOPMENT; MATERIALS PROCESS; MECHANICAL RESPONSE; NUCLEATION AND GROWTH; REQUIRED DURATION; SHORT-PULSE LASERS; TEMPORAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPE; TRANSMISSION ELECTRON MICROSCOPY (TEM);

MATERIALS SCIENCE;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 84858795864     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cossms.2011.07.001     Document Type: Review

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