A method to determine the local surface profile from reconstructed exit waves

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1352-1359

  Wang, A ^a   Chen, F R ^b   Van Aert, S ^a   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Channelling theory; Crystalline structure; Defocus; Electron scattering; Image simulation

Indexed keywords

ATOMIC SCALE; CHANNELLING THEORY; COMPLEX WAVES; CRYSTALLINE STRUCTURE; DEFOCUS; DELOCALIZATIONS; IMAGE SIMULATIONS; LOCAL DEVIATION; LOCAL STRUCTURE; LOCAL SURFACES; STRUCTURE PARAMETER;

CRYSTALLINE MATERIALS; ELECTRON ENERGY LOSS SPECTROSCOPY; SURFACE ROUGHNESS;

ATOMS;

ARTICLE; CHANNELLING THEORY; CRYSTAL STRUCTURE; DEFOCUS; ELECTRON BEAM; ELECTRON DIFFRACTION; EXIT WAVE; IMAGE RECONSTRUCTION; IMAGING; PHYSICAL PARAMETERS; PLOTS AND CURVES; SIMULATION; STATIC ELECTRICITY; SURFACE PROPERTY; THEORY;

EID: 80051824671     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.04.005     Document Type: Article

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