A method for accurate localisation of EBSD pattern centres

Ultramicroscopy

Volumn 111, Issue 2, 2011, Pages 140-148

  Maurice, Claire ^a   Dzieciol, Krzysztof ^a   Fortunier, Roland ^a  

^a LCG   (France)

Author keywords

Calibration; Cross correlation; EBSD; Pattern centre

Indexed keywords

CAMERA POSITIONS; CROSS CORRELATIONS; DISPLACEMENT FIELD; EBSD; EBSD PATTERN; EXACT SOLUTION; ITERATIVE PROCEDURES; LOCALISATION; NOISE LEVELS; PATTERN CENTRE; REGIONS OF INTEREST;

DIFFRACTION;

CALIBRATION;

ACCURACY; ARTICLE; AUTOMATION; CAMERA; CLASSIFICATION ALGORITHM; CONTROLLED STUDY; ELECTRON BACK SCATTERED DIFFRACTION; ELECTRON DIFFRACTION; IMAGE PROCESSING; IMAGE QUALITY; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; PROCESS DEVELOPMENT; PROCESS MODEL; SIGNAL NOISE RATIO;

ALGORITHMS; CALIBRATION; CRYSTALLOGRAPHY; IMAGE ENHANCEMENT; MICROSCOPY, ELECTRON, SCANNING; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; ROTATION; STATISTICS AS TOPIC;

EID: 78449238724     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.10.007     Document Type: Article

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