EBSD-based continuum dislocation microscopy

International Journal of Plasticity

Volumn 26, Issue 8, 2010, Pages 1234-1247

  Gardner, Calvin J ^a   Adams, Brent L ^a   Basinger, John ^a   Fullwood, David T ^a  

^a Brigham Young University   (United States)

Author keywords

A. Dislocations; A. Grain boundaries; B. Polycrystalline material; C. Boundary integral equations; C. Electron microscopy

Indexed keywords

A. DISLOCATIONS; A. GRAIN BOUNDARIES; B. POLYCRYSTALLINE MATERIAL; C. BOUNDARY INTEGRAL EQUATIONS; CROSS CORRELATIONS; ELASTIC DISTORTION; ELASTIC FIELDS; ELASTIC PROPERTIES; ELECTRON BACK SCATTER DIFFRACTION; FREE SURFACES; GEOMETRICALLY NECESSARY DISLOCATIONS; HIGH RESOLUTION; REFERENCE FRAME; SINGLE GRAIN BOUNDARIES; TRACTION-FREE BOUNDARY CONDITIONS;

ACOUSTIC FIELD MEASUREMENT; BOUNDARY INTEGRAL EQUATIONS; CRYSTALLOGRAPHY; DATA STRUCTURES; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; GREEN'S FUNCTION; METALS; POLYCRYSTALLINE MATERIALS; RECOVERY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SURFACES; TENSORS;

HIGH RESOLUTION ELECTRON MICROSCOPY;

EID: 77955512608     PISSN: 07496419     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijplas.2010.05.008     Document Type: Article

References (35)

1. B.L. Adams, S.I. Wright, and K. Kunze Orientation imaging: the emergence of a new microscopy Metall. Mater. Trans. A 24 1993 819 831
2. B.L. Adams, C. Nylander, B. Aydelotte, S. Ahmadi, C. Landon, B. Stucker, and G. Janaki Accessing the elastic-plastic properties closure by rotation and lamination Acta Mater. 56 2008 128 139
3. M.N. Alam, M. Blackman, and D.W. Pashley High-angle Kikuchi patterns Proc. R. Soc. Lond. Ser. A Math. Phys. Sci. 221 1954 224 242
4. I. Alber, J.L. Bassani, M. Khantha, V. Vitek, and G.J. Wang Grain boundaries as heterogeneous systems: atomic and continuum elastic properties Philos. Trans. R. Soc. Lond. 339 1992 555 586
5. A.P. Day Spherical EBSD J. Microsc. 230 2008 472 486
6. B.S. El-Dasher, B.L. Adams, and A.D. Rollett Viewpoint: experimental recovery of geometrically necessary dislocation density in polycrystals Scripta Mater. 48 2003 141
7. J.D. Eshelby The determination of the elastic field of an ellipsoidal inclusion, and related problems Proc. R. Soc. Lond. Ser. A Math. Phys. Sci. 24 1957 376 396
8. D.P. Field, P.B. Trivedi, S.I. Wright, and M. Kumar Analysis of local orientation gradients in deformed single crystals Ultramicroscopy 103 2005 33 39
9. D. Fullwood, S. Niezgoda, B. Adams, and S. Kalidindi Microstructure sensitive design for performance optimization Prog. Mater. Sci. 55 2010 477 562
10. D.T. Fullwood, S.R. Kalidindi, B.L. Adams, and S. Ahmadi A discrete Fourier transform framework for localization relations Comput. Mater. Continua 299 2009 1 14
11. J. Kacher, B.L. Adams, D. Fullwood, and C. Landon Separating coincident electron backscatter diffraction patterns near interfaces Appl. Texture Anal. Ceram. Trans. 201 2008 147 154
12. J. Kacher, C.D. Landon, B.L. Adams, and D.T. Fullwood Bragg's Law diffraction simulations for electron backscatter diffraction analysis Ultramicroscopy 109 2009 1148 1156
13. J. Kacher, J. Basinger, B.L. Adams, and D.T. Fullwood Reply to comment by Maurice et al. in response to "Bragg's Law diffraction simulations for electron backscatter diffraction analysis" Ultramicroscopy 110 2010 741 743
14. E. Kröner Kontinuumstheorie der Versetzungen und Eigenspannungen 1958 Springer Berlin
15. E. Kröner Continuum Theory of Defects. Physics of Defects 1981 North-Holland Amsterdam
16. E. Kröner Statistical Modelling. Modeling Small Deformation in Polycrystals 1986 Elsevier Science Publishers Amsterdam
17. E. Kröner Benefits and shortcomings of the continuous theory of dislocations Int. J. Solids Struct. 38 2001 1115 1134
18. C.D. Landon, B. Adams, and J. Kacher High resolution methods for characterizing mesoscale dislocation structures J. Eng. Mater. Technol. 130 2008 021004 021008
19. R.J. McCabe, G. Proust, E.K. Cerreta, and A. Misra Quantitative analysis of deformation twinning in zirconium Int. J. Plasticity 25 2009 454 472
20. T. Mura Micromechanics of Defects in Solids 1987 Martinus Nijhoff Publishers Boston
21. S. Nishikawa, and S. Kikuchi Diffraction of cathode rays by calcite Nature 122 1928 726
22. J.F. Nye Some geometrical relations in dislocated crystals Acta Metall. 1 1953 153 162
23. B. Petit, N. Gey, M. Cherkaoui, B. Bolle, and M. Humbert Deformation behavior and microstructure/texture evolution of an annealed 304 AISI stainless steel sheet. Experimental and micromechanical modeling Int. J. Plasticity 23 2007 323 341
24. A.J. Schwartz, M. Kumar, D.P. Field, and B.L. Adams Electron Backscatter Diffraction in Materials Science 2000 Springer New York
25. L. St-Pierre, E. Héripré, M. Dexet, J. Crépin, G. Bertolino, and N. Bilger 3D simulations of microstructure and comparison with experimental microstructure coming from O. I.M. analysis Int. J. Plasticity 24 2008 1516 1532
26. S. Sun, B.L. Adams, and W.E. King Observations of lattice curvature near the interface of a deformed aluminium bicrystal Philos. Mag. A 80 2000 9 25
27. C. Teodosiu Elastic Models of Crystal Defects 1982 Springer-Verlag Berlin
28. S. Torquato Effective stiffness tensor of composite media. I. Exact series expansions J. Mech. Phys. Solids 45 1997 1421 1448
29. S. Torquato Random Heterogeneous Materials 2002 Springer-Verlag New York
30. K.Z. Troost, P. van der Sluis, and D.J. Gravesteijn Microscale elastic-strain determination by backscatter Kikuchi diffraction in the scanning electron microscope Appl. Phys. Lett. 62 1993 1110
31. J.A. Venables, and C.J. Harland Electron back-scattering patterns - a new technique for obtaining crystallographic information in the scanning electron microscope Philos. Mag. 27 1973 1193 1200
32. J.A. Venables, and R. Bin-Jaya Accurate microcrystallography using electron back-scattering patterns Philos. Mag. 35 1977 1317 1332
33. S. Villert, C. Maurice, C. Wyon, and R. Fortunier Accuracy assessment of elastic strain measurement by EBSD J. Microsc. 233 2009 290 301
34. A.J. Wilkinson, G. Meaden, and D.J. Dingley High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity Ultramicroscopy 106 2006 307 313
35. Z. Zhao, M. Ramesh, D. Raabe, A.M. Cuitiño, and R. Radovitzky Investigation of three-dimensional aspects of grain-scale plastic surface deformation of an aluminium oligocrystal Int. J. Plasticity 24 2008 2278 2297