Defect detection of solar cells in electroluminescence images using Fourier image reconstruction

Solar Energy Materials and Solar Cells

Volumn 99, Issue , 2012, Pages 250-262

  Tsai, Du Ming ^a   Wu, Shih Chieh ^a   Li, Wei Chen ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Defect detection; Fourier transform; Solar cell; Surface inspection

Indexed keywords

ALTERNATIVE SOURCE; AUTOMATIC INSPECTION; CCD IMAGING SYSTEMS; COMPUTATION TIME; CRYSTAL GRAINS; CRYSTALLINE SILICONS; DARK REGION; DEFECT DETECTION; DEFECT INSPECTION; ELECTRICAL CURRENT; EXTRINSIC DEFECTS; FOURIER; FOURIER IMAGES; FREQUENCY COMPONENTS; GRAY-LEVEL; INFRARED LIGHT; INSPECTION IMAGE; MULTICRYSTALLINE SOLAR CELLS; ORIGINAL IMAGES; PRACTICAL IMPLEMENTATION; RECONSTRUCTED IMAGE; REFERENCE IMAGE; SELF-REFERENCES; SMALL CRACK; SPATIAL IMAGES; SPECTRAL IMAGES; SURFACE INSPECTION;

CRACK DETECTION; CRACKS; ELECTROLUMINESCENCE; FOURIER TRANSFORMS; GRAIN BOUNDARIES; IMAGE RECONSTRUCTION; INSPECTION; SOLAR CELLS; SOLAR ENERGY;

SURFACE DEFECTS;

EID: 84856518966     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2011.12.007     Document Type: Article

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