Solar cell crack inspection by image processing

Proceedings of 2004 International Conference on the Business of Electronic Product Reliability and Liability

Volumn , Issue , 2004, Pages 77-80

  Fu, Zhuang ^a   Zhao, Yanzheng ^a   Liu, Yang ^a   Cao, Qixin ^a   Chen, Mingbo ^b   Zhang, Jun ^b   Jay, Lee ^c  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b Shanghai Institute of Space Power Sources   (China)

^c UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

Contour detection; Crack distinguishing; Solar cell

Indexed keywords

BONDING; CONTOUR FOLLOWERS; CRACKS; LAPLACE TRANSFORMS; LIFE CYCLE; NUMERICAL ANALYSIS; PRODUCT DESIGN; PROTONS; RELIABILITY; SOLAR CELLS;

ANTI-RADIATION; CONTOUR DETECTION; CRACK DISTINGUISHING; IMAGE ADJUSTMENT;

IMAGE PROCESSING;

EID: 4544381037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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