Robust fabric defect detection and classification using multiple adaptive wavelets

IEE Proceedings: Vision, Image and Signal Processing

Volumn 152, Issue 6, 2005, Pages 715-723

  Yang, X ^a,b   Pang, G ^a   Yung, N ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b HEFEI UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE SYSTEMS; CLASSIFICATION (OF INFORMATION); PATTERN RECOGNITION SYSTEMS; ROBUSTNESS (CONTROL SYSTEMS);

ADAPTIVE WAVELETS; FABRIC DEFECT DETECTION; FABRIC IMAGES; THRESHOLD CLASSIFIERS;

WAVELET TRANSFORMS;

EID: 29144497884     PISSN: 1350245X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-vis:20045131     Document Type: Conference Paper

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