-
1
-
-
0030861195
-
An efficient topological characterization of gray-levels textures using a multiresolution representation
-
Pikaz A., Averbuch A. An efficient topological characterization of gray-levels textures using a multiresolution representation. Graphical Models and Image Processing. 59:1997;1-17.
-
(1997)
Graphical Models and Image Processing
, vol.59
, pp. 1-17
-
-
Pikaz, A.1
Averbuch, A.2
-
3
-
-
0002438592
-
Finding and evaluating defects in glass
-
H. Freeman. New York: Academic Press
-
Wilder J. Finding and evaluating defects in glass. Freeman H. Machine Vision for Inspection and Measurement. 1989;237 Academic Press, New York.
-
(1989)
Machine Vision for Inspection and Measurement
, pp. 237
-
-
Wilder, J.1
-
4
-
-
0012664811
-
Web process inspection using neural classification of scattering light
-
J. Olsson, S. Gruber, Web process inspection using neural classification of scattering light, Proceedings of the IEEE International Conference on Industrial Electronics, Control, Instrumentation and Automation (IECON'92), 1992, pp. 1443-1448.
-
(1992)
Proceedings of the IEEE International Conference on Industrial Electronics, Control, Instrumentation and Automation (IECON'92)
, pp. 1443-1448
-
-
Olsson, J.1
Gruber, S.2
-
5
-
-
0005243990
-
Vision system for on-line surface inspection in aluminum casting process
-
C. Fernandez, C. Platero, P. Campoy, R. Aracil, Vision system for on-line surface inspection in aluminum casting process, Proceedings of the IEEE International Conference on Industrial Electronics, Control, Instrumentation and Automation (IECON' 93), 1993, pp. 1854-1859.
-
(1993)
Proceedings of the IEEE International Conference on Industrial Electronics, Control, Instrumentation and Automation (IECON' 93)
, pp. 1854-1859
-
-
Fernandez, C.1
Platero, C.2
Campoy, P.3
Aracil, R.4
-
6
-
-
0030211309
-
Designing defect classification system: A case study
-
Brzakovic D., Vujovic N. Designing defect classification system: a case study. Pattern Recognition. 29:1996;1401-1419.
-
(1996)
Pattern Recognition
, vol.29
, pp. 1401-1419
-
-
Brzakovic, D.1
Vujovic, N.2
-
7
-
-
0042680618
-
Template guided visual inspection
-
Santa Margherita Ligure, Italy
-
A. Noble, V.D. Nguyen, C. Marinos, A.T. Tran, J. Farley, K. Hedengren, J.L. Mundy, Template guided visual inspection, Proceedings of the Second European Conference on Compute Vision, Santa Margherita Ligure, Italy, 1992, pp. 893-901.
-
(1992)
Proceedings of the Second European Conference on Compute Vision
, pp. 893-901
-
-
Noble, A.1
Nguyen, V.D.2
Marinos, C.3
Tran, A.T.4
Farley, J.5
Hedengren, K.6
Mundy, J.L.7
-
10
-
-
0026451901
-
Maximum likelihood unsupervised textured image segmentation
-
Cohen F.S. Maximum likelihood unsupervised textured image segmentation. CVGIP: Graphical Models and Image Processing. 54:1992;239-251.
-
(1992)
CVGIP: Graphical Models and Image Processing
, vol.54
, pp. 239-251
-
-
Cohen, F.S.1
-
11
-
-
0027259669
-
A modular artificial neural network for texture processing
-
Van Hulle M.M., Tollenaere T. A modular artificial neural network for texture processing. Neural Networks. 6:1993;7-32.
-
(1993)
Neural Networks
, vol.6
, pp. 7-32
-
-
Van Hulle, M.M.1
Tollenaere, T.2
-
12
-
-
0030244413
-
Statistical methods to compare the texture features of machined surfaces
-
Ramana K.V., Ramamoorthy B. Statistical methods to compare the texture features of machined surfaces. Pattern Recognition. 29:1996;1447-1459.
-
(1996)
Pattern Recognition
, vol.29
, pp. 1447-1459
-
-
Ramana, K.V.1
Ramamoorthy, B.2
-
14
-
-
85027634146
-
Edge-based texture measures for surface inspection
-
The Hague, The Netherlands
-
T. Ojala, M. Pietikäinen, O. Silven, Edge-based texture measures for surface inspection, Proceedings of the 11th International Conference on Pattern Recognition, The Hague, The Netherlands, 1992, pp. B594-B598.
-
(1992)
Proceedings of the 11th International Conference on Pattern Recognition
-
-
Ojala, T.1
Pietikäinen, M.2
Silven, O.3
-
17
-
-
0019038770
-
Texture analysis: A survey
-
Wechsler H. Texture analysis: a survey. Signal Processing. 2:1980;271-282.
-
(1980)
Signal Processing
, vol.2
, pp. 271-282
-
-
Wechsler, H.1
-
18
-
-
0032091410
-
Circular neighborhood and 1D DFT features for texture classification and segmentation
-
Arof H., Deravi F. Circular neighborhood and 1D DFT features for texture classification and segmentation. IIE Proc. Vision, Image and Signal Processing. 145:1998;167-172.
-
(1998)
IIE Proc. Vision, Image and Signal Processing
, vol.145
, pp. 167-172
-
-
Arof, H.1
Deravi, F.2
-
20
-
-
0029514428
-
A neural network image classification system for automatic inspection
-
Mashford J.S. A neural network image classification system for automatic inspection. Proc. IEEE Inter. Conf. Neural Networks. 2:1995;713-717.
-
(1995)
Proc. IEEE Inter. Conf. Neural Networks
, vol.2
, pp. 713-717
-
-
Mashford, J.S.1
-
21
-
-
0028712077
-
A performance evaluation of texture measures for image classification and segmentation using cascade-correlation architecture
-
Augusteijn M.F., Clemens L.E. A performance evaluation of texture measures for image classification and segmentation using cascade-correlation architecture. IEEE Inter. Conf. Neural Networks IEEE World Congress Comput. Intell. 7:1994;4300-4305.
-
(1994)
IEEE Inter. Conf. Neural Networks IEEE World Congress Comput. Intell.
, vol.7
, pp. 4300-4305
-
-
Augusteijn, M.F.1
Clemens, L.E.2
-
22
-
-
0031637165
-
A vision system for surface roughness assessment using neural networks
-
Tsai D.-M., Chen J.-J., Chen J.-F. A vision system for surface roughness assessment using neural networks. Inter. J. Adv. Manuf. Technol. 14:1998;412-422.
-
(1998)
Inter. J. Adv. Manuf. Technol.
, vol.14
, pp. 412-422
-
-
Tsai, D.-M.1
Chen, J.-J.2
Chen, J.-F.3
-
25
-
-
0025926886
-
Defect inspection system for patterned wafers based on the spatial-frequency filtering
-
New York
-
T. Ohshige, H. Tanaka, Y. Miyazaki, T. Kanda, H. Ichimura, N. Kosaka, T. Tomoda, Defect inspection system for patterned wafers based on the spatial-frequency filtering, The 11th IEEE/CHMT international Electronics Manufacturing Technology Symposium, New York, 1991, pp. 192-196.
-
(1991)
The 11th IEEE/CHMT International Electronics Manufacturing Technology Symposium
, pp. 192-196
-
-
Ohshige, T.1
Tanaka, H.2
Miyazaki, Y.3
Kanda, T.4
Ichimura, H.5
Kosaka, N.6
Tomoda, T.7
-
26
-
-
0024048781
-
The generalized Gabor scheme of image representation in biological and machine vision
-
Porat M., Zeevi Y.Y. The generalized Gabor scheme of image representation in biological and machine vision. IEEE Trans. Pattern Anal. Mach. Intell. 10:1988;452-468.
-
(1988)
IEEE Trans. Pattern Anal. Mach. Intell.
, vol.10
, pp. 452-468
-
-
Porat, M.1
Zeevi, Y.Y.2
-
27
-
-
0001974282
-
Gabor filter design for multiple texture segmentation
-
Weldon T.P., Higgins W.E., Dunn D.F. Gabor filter design for multiple texture segmentation. Opt. Engng. 35:1996;2852-2863.
-
(1996)
Opt. Engng.
, vol.35
, pp. 2852-2863
-
-
Weldon, T.P.1
Higgins, W.E.2
Dunn, D.F.3
-
30
-
-
85031585561
-
-
A method and means for recognizing complex patterns, US Pattern 3069654, 1962
-
P.V.C. Hough, A method and means for recognizing complex patterns, US Pattern 3069654, 1962.
-
-
-
Hough, P.V.C.1
-
31
-
-
0015285440
-
Use of the Hough transformation to detect lines and curves in pictures
-
Duda R.O., Hart P.E. Use of the Hough transformation to detect lines and curves in pictures. Commun. Assoc. Comput. Mach. 15:1972;11-15.
-
(1972)
Commun. Assoc. Comput. Mach.
, vol.15
, pp. 11-15
-
-
Duda, R.O.1
Hart, P.E.2
-
32
-
-
38249038719
-
Image space transforms for detecting straight edges in industrial images
-
Davis E.R. Image space transforms for detecting straight edges in industrial images. Pattern Recognition Lett. 4:1986;185-192.
-
(1986)
Pattern Recognition Lett.
, vol.4
, pp. 185-192
-
-
Davis, E.R.1
|