Defect detection scheme for web surface inspection

International Journal of Pattern Recognition and Artificial Intelligence

Volumn 14, Issue 6, 2000, Pages 735-755

  Iivarinen, Jukka ^d   Heikkinen, Katriina ^c   Rauhamaa, Juhani ^a   Vuorimaa, Petri ^d   Visa, Ari ^b  

^a ABB OY   (Finland)

^b TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^c NOKIA RESEARCH CENTER   (United States)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; IMAGE ANALYSIS; IMAGE SEGMENTATION; ONLINE SYSTEMS; REAL TIME SYSTEMS;

GRAY LEVEL THRESHOLDING TECHNIQUES; WEB SURFACE INSPECTION;

FEATURE EXTRACTION;

EID: 0034266846     PISSN: 02180014     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0218-0014(00)00050-7     Document Type: Article

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