Automatic saw-mark detection in multicrystalline solar wafer images

Solar Energy Materials and Solar Cells

Volumn 95, Issue 8, 2011, Pages 2206-2220

  Li, Wei Chen ^a   Tsai, Du Ming ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Defect detection; Fourier transform; Multicrystalline silicon; Saw mark; Solar wafer; Surface inspection

Indexed keywords

DEFECT DETECTION; FOURIER; MULTICRYSTALLINE SILICON; SAW-MARK; SOLAR WAFER; SURFACE INSPECTION;

COMPUTER VISION; CRYSTAL IMPURITIES; CRYSTAL ORIENTATION; DEFECTS; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; POLYSILICON; SAWING; SEMICONDUCTING SILICON COMPOUNDS; SOLAR POWER GENERATION; SURFACE DEFECTS; SURFACES;

SILICON WAFERS;

EID: 79958153255     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2011.03.025     Document Type: Article

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