Investigation of indirect structural and chemical parameters of GeSi nanoparticles in a silica matrix by combined synchrotron radiation techniques

Journal of Applied Crystallography

Volumn 45, Issue 1, 2012, Pages 71-84

  Gasperini, Antonio ^a,b   Malachias, Angelo ^a,c   Fabbris, Gilberto ^a,b   Kellermann, Guinther ^a,d   Gobbi, Angelo ^a   Avendão, Esteban ^a   Azevedo, Gustavo De Medeiros ^a,e  

^a LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

^c FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^d FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^e FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

anomalous diffraction; extended X ray absorption fine structure; GeSi nanoparticles; grazing incidence small angle X ray scattering; X ray diffraction

Indexed keywords

ANOMALOUS DIFFRACTION; AVERAGE DIAMETER; CHEMICAL PARAMETERS; CORE SHELL STRUCTURE; CRYSTALLINE DOMAINS; CRYSTALLINE GE; EXTENDED X-RAY ABSORPTION FINE STRUCTURE ANALYSIS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; GE ATOM; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; LOCAL COMPOSITIONS; LOCAL STRAINS; MATRIX; SILICA MATRIX; SIZE DISPERSION; SYNCHROTRON BASED TECHNIQUES; SYNCHROTRON RADIATION TECHNIQUES; X-RAY DIFFRACTION MEASUREMENTS;

ABSORPTION SPECTRA; CHEMICAL ANALYSIS; CHEMICAL PROPERTIES; CRYSTALLINE MATERIALS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; GERMANIUM; SCATTERING; SILICA; SILICON COMPOUNDS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY ABSORPTION; X RAY DIFFRACTION; X RAY SCATTERING;

NANOPARTICLES;

EID: 84855959097     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811049302     Document Type: Article

References (56)

1. Aksenov, V. L., Kuzmin, A. Y., Purans, J. & Tyutyunnikov, S. I. (2001). Phys. Part. Nuclei, 32, 1-33.
2. Aldrich, D. B., Nemanich, R. J. & Sayers, D. E. (1994). Phys. Rev. B, 50, 15026-15033.
3. Araújo, L. L., Foran, G. J. & Ridgway, M. C. (2008). J. Phys. Condens. Matter, 20, 165210.
4. Araújo, L. L., Giulian, R., Sprouster, D. J., Schnohr, C. S., Llewellyn, D. J., Kluth, P., Cookson, D. J., Foran, G. J. & Ridgway,M. C. (2008). Phys. Rev. B, 78, 094112.
5. Araújo, L. L., Kluth, P., Azevedo, G. de M. & Ridgway, M. C. (2006). Phys. Rev. B, 74, 184102.
6. Aubry, J. C., Tyliszczak, T., Hitchcock, A. P., Baribeu, J.-M. & Jackman, T. E. (1999). Phys. Rev. B, 59, 12872-12883.
7. Azevedo, G. de M., Glover, C. J., Ridgway, M. C., Yu, K. M. & Foran, G. J. (2003). Phys. Rev. B, 68, 115204.
8. Azevedo, G. de M., Ridgway, M. C., Yu, K. M., Glover, C. J. & Foran, G. J. (2002). Nucl. Instrum. Methods Phys. Res. Sect. B, 190, 851-855.
9. Bernas, H. (2009). Editor. Materials Science with Ion Beams, Topics in Applied Physics, Vol. 116. Berlin, Heidelberg: Springer.
10. Billinge, S. J. & Levin, I. (2007). Science, 316, 561-565.
11. Bonafos, C., Garrido, B., Lopez, M., Perez-Rodriguez, A., Morante, J. R., Kihn, Y., Ben Assayag, G. & Claverie, A. (2000). Appl. Phys. Lett. 76, 3962-3964.
12. Bording, J. K. & Tafto, J. (2000). Phys. Rev. B, 62, 8098-8103.
13. Cheung, A., Azevedo, G. de M., Glover, C. J., Llewellyn, D. J., Elliman, R. G., Foran, G. J. & Ridgway, M. C. (2004). Appl. Phys. Lett. 84, 278-280.
14. Dismukes, P., Ekstrom, L. & Paff, R. F. (1964). J. Phys. Chem. 68, 3021-3027.
15. Dowd, A., Ellimann, R. G. & Luther-Davies, B. (2001). Appl. Phys. Lett. 79, 2327-2329.
16. Frenkel, A. I., Hills, C.W. & Nuzzo, R. G. (2001). Phys. Chem. B, 105, 12689-12703.
17. Fukumi, K., Chayahara, A., Kadono, K., Sakaguchi, T., Horino, Y., Miya, M., Fujii, K., Hayakawa, J. & Satou, M. (1994). J. Appl. Phys. 75, 3075-3080.
18. Gilbert, B., Huang, F., Zhang, H., Waychunas, G. A. & Banfield, J. F. (2004). Science, 305, 651-654.
19. Glover, C. J., Ridgway, M. C., Yu, K. M., Foran, G. J., Desnica-Frankovic, I. D., Clerc, C., Hansen, J. L. & Nylandsted Larsen, A. (2001). Phys. Rev. B, 63, 073204.
20. Hamanaka, Y., Fukuta, K., Nakamura, A., Liz-Marzán, L. M. & Mulvaney, P. (2004). Appl. Phys. Lett. 84, 4938-4940.
21. Kasper, E. (1995). J. Cryst. Growth, 150, 921-925.
22. Keating, P. N. (1996). Phys. Rev. 145, 637-645.
23. Kinning, D. J. & Thomas, E. L. (1984). Macromolecules, 17, 1712-1718.
24. Kolobov, A. V., Wei, S. Q., Yan, W. S., Oyanagi, H., Maeda, Y. & Tanaka, K. (2003). Phys. Rev. B, 67, 195314.
25. Kotlarchyk, M. & Chen, S.-H. (1983). J. Chem. Phys. 79, 2461-2469.
26. Lee,M., Kim, T. S. & Choi, Y. S. (1997). J. Non-Cryst. Solids, 211, 143-149.
27. Lee, P. A., Citrin, P. H., Eisenberger, P. & Kincaid, B. M. (1981). Rev. Mod. Phys. 53, 769-806.
28. Lifshitz, I. M. & Slyozov, V. V. (1961). J. Phys. Chem. Solids, pp. 35-50.
29. Maeda, Y. (1995). Phys. Rev. B, 51, 1658-1670.
30. Magalhães-Paniago, R., Medeiros-Ribeiro, G., Malachias, A., Kycia, S., Kamins, T. I. & Williams, R. S. (2002). Phys. Rev. B, 66, 245312.
31. Modrow, H. (2004). Appl. Spectrosc. Rev. 39, 183-290.
32. Newville, M. (2001). J. Synchrotron Rad. 8, 322-324.
33. Paniago, R., Forrest, R., Chow, P. C., Moss, S. C., Parkin, S. S. P. & Cookson, D. (1997). Phys. Rev. B, 56, 13442-13454.
34. Park, C. J., Cho, K. H., Yang, W.-C., Cho, H. Y., Choi, S.-H., Elliman, R. G., Han, J. H. & Kim, C. (2006). Appl. Phys. Lett. 88, 071916.
35. Pavesi, L., Dal Negro, L., Mazzoleni, C., Franzò, G. & Priolo, F. (2000). Nature (London), 408, 440-444.
36. Pedersen, J. S. (1994). J. Appl. Cryst. 27, 595-608.
37. Percus, J. K. & Yevick, G. J. (1958). Phys. Rev. 110, 1-13.
38. Rauscher, M., Paniago, R., Metzger, H., Kovats, Z., Domke, J., Peisl, J., Pfannes, H. D., Schulze, J. & Eisele, I. (1999). J. Appl. Phys. 86, 6763-6769.
39. Ravel, B. & Newville, M. (2005). J. Synchrotron Rad. 12, 537-541.
40. Rebohle, L., von Borany, J., Fröb, H. & Skorupa, W. (2000). Appl. Phys. B Lasers Opt. 71, 131-151.
41. Rehr, J. J. & Albers, R. C. (2000). Rev. Mod. Phys. 72, 621-654.
42. Renaud, G., Lazzari, R. & Leroy, F. (2009). Surf. Sci. Rep. 64, 255-380.
43. Revenant, C., Leroy, F., Lazzari, R., Renaud, G. & Henry, C. R. (2004). Phys. Rev. B, 69, 035411.
44. Ridgway, M. C., Azevedo, G. de M., Glover, C. J., Elliman, R. G., Llewellyn, D. J., Cheung, A., Johannessen, B., Brett, D. A. & Foran, G. J. (2004). Nucl. Instrum. Methods Phys. Rev. Sect. B, 218, 421-426.
45. Ridgway, M. C., Yu, K. M., Glover, C. J., Foran, G. J. & Clerc, C. (1999). Phys. Rev. B, 60, 10831-10836.
46. Rockenberger, J., Tröger, L., Kornowski, A., Vossmeyer, T., Eychmüller, A., Feldhaus, J. & Welle, H. (1997). J. Phys. Chem. B, 101, 2691-2701.
47. Rockenberger, J., Tröger, L., Rogach, A. L., Tischer, M., Grundmann, M., Eychmüller, A. & Weller, H. (1998). J. Chem. Phys. 108, 7807-7815.
48. Sun, Z., Wei, S., Kolobov, A. V., Oyanagi, H. & Brunner, K. (2005). Phys. Rev. B, 71, 245334.
49. Tsoukalas, D., Dimitrakis, P., Kolliopoulou, S. & Normand, P. (2005). Mater. Sci. Eng. B, 124-125, 93-101.
50. Vincent, B., Damlencourt, J. F., Rivallin, P., Nolot, E., Licitra, C., Morand,Y.&Clavelier, L. (2007). Semicond. Sci. Technol. 22, 237-244.
51. Wagner, V. C. (1961). Z. Elektrochem. 65, 581-591.
52. Waseda, Y. (2002). Anomalous X-ray Scattering for Materials Characterization. Berlin: Springer.
53. Wertheim, M. S. (1963). Phys. Rev. Lett. 10, 321-323.
54. Yonenaga, I. & Sakurai, M. (2001). Phys. Rev. B, 64, 113206.
55. Zabinsky, S. I., Rehr, J. J., Ankudinov, A., Albers, R. C. & Eller, M. J. (1995). Phys. Rev. B, 52, 2995-3009.
56. Zhang, B., Shrestha, S., Green, M. A. & Conibeer, G. (2010). Appl. Phys. Lett. 96, 261901.