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Volumn 64, Issue 11, 2001, Pages 1132061-1132063
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Bond lengths in Ge1-xSix crystalline alloys grown by the Czochralski method
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Author keywords
[No Author keywords available]
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Indexed keywords
ALLOY;
GERMANIUM;
SILICON;
ANALYTIC METHOD;
ARTICLE;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
IONIZATION CHAMBER;
RADIATION ABSORPTION;
SAMPLING;
THICKNESS;
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EID: 0035884109
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (39)
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References (22)
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