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Note that the resulting sub-micron-sized crystallites still rendered structural information indicative of bulk material. Also, the presence of both residual Si (from the Si layer originally separating the Ge and (Formula presented) layers) and dislocations did not influence the structural parameter measurements as deduced from a comparison of a MBE-grown, crystalline Ge sample prepared as above with that fabricated from a bulk, crystalline Ge wafer.
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Note that the resulting sub-micron-sized crystallites still rendered structural information indicative of bulk material. Also, the presence of both residual Si (from the Si layer originally separating the Ge and (Formula presented) layers) and dislocations did not influence the structural parameter measurements as deduced from a comparison of a MBE-grown, crystalline Ge sample prepared as above with that fabricated from a bulk, crystalline Ge wafer.
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)] can effectively determine asymmetry in single-constituent shells, this form of analysis is not applicable for the present samples. An appropriate, analogous methodology is under development for mixed-constituent shells.
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Note that in the comparison of the structural parameters presented herein, the changes in absolute value were typically within the bounds of experimental uncertainty. However, the relative changes were consistently measured over the extent of the composition range examined and were thus considered experimentally valid.
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Note that in the comparison of the structural parameters presented herein, the changes in absolute value were typically within the bounds of experimental uncertainty. However, the relative changes were consistently measured over the extent of the composition range examined and were thus considered experimentally valid.
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Note that a range of experimentally determined structural parameters have been reported for amorphous Ge as potentially dependent on sample preparation methodologies that include sputtering, evaporation, plasma decomposition and vapor deposition. For example, G. Dalba, P. Fornasini, M. Grazioli, and F. Rocca, Phys. Rev. B 52, 11 034 (1995);
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