Multiple scattering effects on the EXAFS of Ge nanocrystals

Journal of Physics Condensed Matter

Volumn 20, Issue 16, 2008, Pages

  Araujo, L L ^a   Foran, G J ^b   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; GERMANIUM; PARAMETER ESTIMATION; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR QUANTUM DOTS;

INTERATOMIC DISTANCE DISTRIBUTIONS; STRUCTURAL PARAMETERS;

NANOCRYSTALS;

EID: 42549157996     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/16/165210     Document Type: Article

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