The contribution of particle core and surface to strain, disorder and vibrations in thiolcapped CdTe nanocrystals

Journal of Chemical Physics

Volumn 108, Issue 18, 1998, Pages 7807-7815

  Rockenberger, Jorg ^a   Troger, Larc ^b   Rogach, Andrey L ^a,d   Tischer, Markus ^b   Grundmann, Marius ^c   Eychmuller, Alexander ^a   Weller, Horst ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

^b DESY   (Germany)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^d BELARUSIAN STATE UNIVERSITY   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000863495     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.476216     Document Type: Article

References (40)

1. A. Henglein, Chem. Rev. 89, 1861 (1989); M. G. Bawendi, M. L. Steigerwald, and L. E. Brus, Annu. Rev. Phys. Chem. 41, 477 (1990); H. Weller, Angew. Chem. Int. Ed. Engl. 32, 41 (1993); H. Weller and A. Eychmüller, in Semiconductor Nanoclusters, edited by P. V. Kamat and D. Meisel (Elsevier, Science, 1996), Vol. 103, p. 5; A. P. Alivisatos, J. Phys. Chem. 100, 13226 (1996); Science 271, 933 (1996).
2. A. Henglein, Chem. Rev. 89, 1861 (1989); M. G. Bawendi, M. L. Steigerwald, and L. E. Brus, Annu. Rev. Phys. Chem. 41, 477 (1990); H. Weller, Angew. Chem. Int. Ed. Engl. 32, 41 (1993); H. Weller and A. Eychmüller, in Semiconductor Nanoclusters, edited by P. V. Kamat and D. Meisel (Elsevier, Science, 1996), Vol. 103, p. 5; A. P. Alivisatos, J. Phys. Chem. 100, 13226 (1996); Science 271, 933 (1996).
3. A. Henglein, Chem. Rev. 89, 1861 (1989); M. G. Bawendi, M. L. Steigerwald, and L. E. Brus, Annu. Rev. Phys. Chem. 41, 477 (1990); H. Weller, Angew. Chem. Int. Ed. Engl. 32, 41 (1993); H. Weller and A. Eychmüller, in Semiconductor Nanoclusters, edited by P. V. Kamat and D. Meisel (Elsevier, Science, 1996), Vol. 103, p. 5; A. P. Alivisatos, J. Phys. Chem. 100, 13226 (1996); Science 271, 933 (1996).
4. A. Henglein, Chem. Rev. 89, 1861 (1989); M. G. Bawendi, M. L. Steigerwald, and L. E. Brus, Annu. Rev. Phys. Chem. 41, 477 (1990); H. Weller, Angew. Chem. Int. Ed. Engl. 32, 41 (1993); H. Weller and A. Eychmüller, in Semiconductor Nanoclusters, edited by P. V. Kamat and D. Meisel (Elsevier, Science, 1996), Vol. 103, p. 5; A. P. Alivisatos, J. Phys. Chem. 100, 13226 (1996); Science 271, 933 (1996).
5. A. Henglein, Chem. Rev. 89, 1861 (1989); M. G. Bawendi, M. L. Steigerwald, and L. E. Brus, Annu. Rev. Phys. Chem. 41, 477 (1990); H. Weller, Angew. Chem. Int. Ed. Engl. 32, 41 (1993); H. Weller and A. Eychmüller, in Semiconductor Nanoclusters, edited by P. V. Kamat and D. Meisel (Elsevier, Science, 1996), Vol. 103, p. 5; A. P. Alivisatos, J. Phys. Chem. 100, 13226 (1996); Science 271, 933 (1996).
6. A. Henglein, Chem. Rev. 89, 1861 (1989); M. G. Bawendi, M. L. Steigerwald, and L. E. Brus, Annu. Rev. Phys. Chem. 41, 477 (1990); H. Weller, Angew. Chem. Int. Ed. Engl. 32, 41 (1993); H. Weller and A. Eychmüller, in Semiconductor Nanoclusters, edited by P. V. Kamat and D. Meisel (Elsevier, Science, 1996), Vol. 103, p. 5; A. P. Alivisatos, J. Phys. Chem. 100, 13226 (1996); Science 271, 933 (1996).
7. L. Spanhel, M. Haase, H. Weller, and A. Henglein, J. Am. Chem. Soc. 109, 5649 (1987).
8. Y. Tian, T. Newton, N. A. Kotov, D. M. Guldi, and J. Fendler, J. Chem. Phys. 100, 8927 (1996).
9. M. A. Hines and P. Guyot-Sionnest, J. Phys. Chem. 100, 468 (1996).
10. B. O. Dabbousi, J. Rodriguez-Viejo, F. V. Mikulec, J. R. Heine, H. Mattoussi, R. Ober, K. F. Jensen, and M. G. Bawendi, J. Phys. Chem. B 101, 9463 (1997).
11. M. Danek, K. F. Jensen, C. B. Murray, and M. G. Bawendi, Chem. Mater. 8, 173 (1996).
12. X. Peng, M. C. Schlamp, A. V. Kadavanich, and A. P. Alivisatos, J. Am. Chem. Soc. 119, 7019 (1997).
13. A. Mews, A. Eychmüller, M. Giersig, D. Schooss, and H. Weller, J. Phys. Chem. 98, 934 (1994).
14. D. Schooss, A. Mews, A. Eychmüller, and H. Weller, Phys. Rev. B 49, 17072 (1994).
15. A. Mews., A. V. Kadavanich, U. Banin, and A. P. Alivisalos, Phys. Rev. B 53, 13242 (1996).
16. W. Hoheisel, V. L Colvin, C. S. Johnson, and A. P. Alivisatos, J. Chem. Phys. 101, 8455 (1994).
17. D. J. Norris, A. Sacra, C. B. Murray, and M. G. Bawendi, Phys. Rev. Lett. 72, 2612 (1994).
18. A. Eychmüller, A. Hässelbarth, L. Katsikas, and H. Weller, Ber. Bunsenges. Phys. Chem. 95, 79 (1991).
19. M. G. Bawendi, P. J. Carroll, W. L. Wilson, and L. E. Brus, J. Chem. Phys. 96, 946 (1992).
20. L. E. Brus, J. A. W. Harkless, and F. H. Stillinger, J. Am Chem. Soc. 118, 4834 (1996).
21. M. Grundmann, O. Stier, and D. Bimberg, Phys. Rev. B 52, 11969 (1995).
22. T. Vossmeyer, G. Reck, L. Katsikas, E. T. K. Haupt, B. Schulz, and H. Weller, Science 267, 1476 (1995).
23. T. Vossmeyer, G. Reck, B. Schulz, L. Katsikas, and H. Weller, J. Am. Chem. Soc. 117, 12881 (1995).
24. A. L. Rogach, L. Katsikas, A. Kornowski, D. Su, A. Eychmüller, and H. Weller, Ber. Bunsenges. Phys. Chem. 100, 1772 (1996).
25. A. Chemseddine and H. Weller, Ber. Bunsenges. Phys. Chem. 97, 636 (1993).
26. T. Vossmeyer, L. Katsikas, M. Giersig, I. G. Popovic, K. Diesner, A. Chemseddine, A. Eychmüller, and H. Weller, J. Phys. Chem. 98, 7665 (1994).
27. J. Rockenberger, L. Tröger, A. Karnowski, T. Vossmeyer, A. Eychmüller, J. Feldhaus, and H. Weller, J. Phys. Chem. B 101, 2691 (1997).
28. R. Prins and D. C. Koningsberger, X-Ray Absorption. Principles. Applications, Techniques of EXAFS, SEXAFS, and XANES (Wiley, New York, 1988).
29. M. Newville, P. Livins, Y. Yacoby, J. J. Rehr, and E. A. Stern, Phys. Rev. B 47, 14126 (1993).
30. E. A. Stem, M. Newville, B. Ravel, Y. Yacoby, and D. Haskel, Physka B 208-209, 154 (1995).
31. J. J. Rehr, R. C. Albers, and S. I. Zabinsky, Phys. Rev. Lett. 69, 3397 (1992).
32. 2= 1.03 for the Te-Cd Shell, respectively.
33. Despite the large number of variables. 32 and 13, theae multi-file-fits involved 44 and 30 degrees of freedom for the Cd and Te K-edge spectra, respectively.
34. Interatomic distances of CdTe and CdS bulk at 8 K determined by EXAFS (2.807 and 2.342 Å) were scaled to the crystallographic values (2,796 and 2.524 Å) taking into account a pressure-induced and a thermal lattice contraction of 0.008 and 0.009 Å, respectively. EXAFS distances of the nanocrystalline sample were changed correspondingly.
35. J. W. Mathews, Epitaxial Growth Part B (Academic New York, 1975).
36. 3 for the CdTe bulk and thiolcapped CdTe nanocrystals, respectively.
37. Cd-S=2.00 were obtained for the Te and S-shell, respectively.
38. A. C. Carter, C. E. Bouldin, K. M. Kemner, M. I. Bell, J. C. Woicik, and S. A. Majetich, Phys. Rev. B 55, 13822 (1997).
39. A. S. Saada, Elasticity: Theory and Applications (Pergamon New York, 1974).
40. Landolt-Börnstein, Numerical Data and Functional Relationship in Science and Technology, New Series, Group III (Springer-Berlin, 1979), Vol. 11, Sec. 1.2.1.