Thickness dependence of structural and optical properties of indium tin oxide nanofiber thin films prepared by electron beam evaporation onto quartz substrates

Materials Science and Engineering: B

Volumn 177, Issue 2, 2012, Pages 145-150

  El Nahass, M M ^a   El Menyawy, E M ^b  

^a Ain Shams University   (Egypt)

^b NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

Indium tin oxide thin films; Optical properties; Structural properties

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL STRUCTURE; ELECTRON BEAMS; ENERGY GAP; EVAPORATION; INDIUM COMPOUNDS; OPTICAL FILMS; OXIDE FILMS; PARTICLE SIZE; QUARTZ; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; STRUCTURAL PROPERTIES; THIN FILMS; TIN OXIDES; X RAY DIFFRACTION;

CRYSTAL STRUCTURE AND MORPHOLOGY; ELECTRON BEAM EVAPORATION; FILM-THICKNESS; INDIUM TIN OXIDE THIN FILMS; QUARTZ SUBSTRATE; STRUCTURAL AND OPTICAL PROPERTIES; THICKNESS DEPENDENCE; THIN-FILMS; X RAY SCANNING; X- RAY DIFFRACTIONS;

FILM THICKNESS;

EID: 84855762331     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2011.10.018     Document Type: Article

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