Thickness dependence of structure and optoelectronic properties of In2O3:Mo films prepared by spray pyrolysis

Thin Solid Films

Volumn 518, Issue 4, 2009, Pages 1271-1274

  Prathap, P ^a   Revathi, N ^a   Reddy, K T Ramakrishna ^a   Miles, R W ^b  

^a SRI VENKATESWARA UNIVERSITY   (India)

^b NORTHUMBRIA UNIVERSITY   (United Kingdom)

Author keywords

Opto electronic properties; Spray pyrolysis; Structure

Indexed keywords

CUBIC CRYSTAL STRUCTURES; ELECTRICAL RESISTIVITY; GROWTH MODES; OPTICAL TRANSMITTANCE; OPTO-ELECTRONIC PROPERTIES; PREFERRED ORIENTATIONS; THICKNESS DEPENDENCE;

CARRIER CONCENTRATION; CARRIER MOBILITY; CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; FILM GROWTH; FILM PREPARATION; MAGNETIC FILMS; MOLYBDENUM; THERMOGRAVIMETRIC ANALYSIS;

SPRAY PYROLYSIS;

EID: 71649098445     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.188     Document Type: Article

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