Preparation and electrical properties of ITO thin films by dip-coating process

Journal of Materials Science

Volumn 31, Issue 7, 1996, Pages 1761-1766

  Nishio, Keishi ^a   Sei, Tadanori ^a   Tsuchiya, Toshio ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COATINGS; DIFFERENTIAL THERMAL ANALYSIS; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; ETHANOL; HEAT TREATMENT; INFRARED SPECTROMETERS; SEMICONDUCTING GLASS; SEMICONDUCTING INDIUM COMPOUNDS; SUBSTRATES; THERMOGRAVIMETRIC ANALYSIS;

ANHYDROUS INDIUM TRICHLORIDE; DIP COATING PROCESS; FOUR TERMINAL METHOD; FOURIER TRANSFORM INFRARED SPECTROMETERS; HIGH PRECISION THIN FILM HEIGHT DIFFERENCE METER; INDIUM TIN OXIDE; VAN DER PAW METHOD;

THIN FILMS;

EID: 0030126868     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00372189     Document Type: Article

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