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Volumn 112, Issue 2, 2008, Pages 641-644

Structural, optical and electrical characteristics of ITO thin films deposited by sputtering on different polyester substrates

Author keywords

Crystal structure; Electrical properties; Optical properties; Sputtering; Thin films

Indexed keywords

CARRIER CONCENTRATION; CONCENTRATION (PROCESS); CRYSTALLITE SIZE; GALLIUM ALLOYS; GLASS; NANOCRYSTALLINE ALLOYS; OPTICAL GLASS; OXIDE FILMS; POSITRON EMISSION TOMOGRAPHY; POWER AMPLIFIERS; THICK FILMS; THIN FILMS; TIN; TITANIUM COMPOUNDS;

EID: 53349127447     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.06.027     Document Type: Article
Times cited : (27)

References (30)
  • 16
    • 53349105133 scopus 로고    scopus 로고
    • Powder Diffraction File, Card no. 49-2301, Joint Committee on Powder Diffraction Standards, International Centre for Diffraction Data, Pennsylvania, 2001.
    • Powder Diffraction File, Card no. 49-2301, Joint Committee on Powder Diffraction Standards, International Centre for Diffraction Data, Pennsylvania, 2001.
  • 17
    • 53349085851 scopus 로고    scopus 로고
    • Powder Diffraction File, Card no. 50-2275, Joint Committee on Powder Diffraction Standards, International Centre for Diffraction Data, Pennsylvania, 2001.
    • Powder Diffraction File, Card no. 50-2275, Joint Committee on Powder Diffraction Standards, International Centre for Diffraction Data, Pennsylvania, 2001.
  • 18
    • 53349093058 scopus 로고    scopus 로고
    • Powder Diffraction File, Card no. 06-0416, Joint Committee on Powder Diffraction Standards, International Centre for Diffraction Data, Pennsylvania, 2001.
    • Powder Diffraction File, Card no. 06-0416, Joint Committee on Powder Diffraction Standards, International Centre for Diffraction Data, Pennsylvania, 2001.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.