Fault diagnosis with orthogonal compactors in scan-based designs

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 27, Issue 5, 2011, Pages 599-609

  Benware, Brady ^a   Mrugalski, Grzegorz ^a   Pogiel, Artur ^a   Rajski, Janusz ^a   Solecki, Jȩdrzej ^b   Tyszer, Jerzy ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Bipartite graphs; Fault diagnosis; Scan based designs; Test response compaction

Indexed keywords

COMPACTION; FAILURE ANALYSIS; SCANNING;

BIPARTITE GRAPHS; PRODUCTION TEST; SCAN CELLS; SCAN COMPRESSIONS; SCAN-BASED DESIGNS; SIMPLE TESTS; TEST-RESPONSE COMPACTION;

FAULT DETECTION;

EID: 84855424686     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-011-5243-6     Document Type: Article

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