Fault diagnosis with convolutional compactors

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 26, Issue 8, 2007, Pages 1478-1494

  Mrugalski, Grzegorz ^a,b   Pogiel, Artur ^c   Rajski, Janusz ^a,b   Tyszer, Jerzy ^a,c   Wang, Chen ^b  

^a IEEE   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

^c POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Convolutional compactors; Fault diagnosis; Scan based designs; Test response compaction; Unknown states

Indexed keywords

CONVOLUTIONAL COMPACTORS; DIAGNOSIS PROCESS; SCAN BASED DESIGNS; TEST RESPONSE COMPACTION;

ALGORITHMS; HEURISTIC METHODS; NETWORKS (CIRCUITS); SIGNAL DETECTION;

FAILURE ANALYSIS;

EID: 34547183939     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2007.891361     Document Type: Article

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