Diagnosis of failing scan cells through orthogonal response compaction

2010 15th IEEE European Test Symposium, ETS'10

Volumn , Issue , 2010, Pages 221-226

  Benware, Brady ^a   Mrugalski, Grzegorz ^a   Pogiel, Artur ^a   Rajski, Janusz ^a   Solecki, Jȩdrzej ^b   Tyszer, Jerzy ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL DESIGN; PRODUCTION TEST; RESPONSE COMPACTION; SCAN CELLS; TEST RESPONSE;

SCANNING;

COMPACTION;

EID: 78049236105     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETSYM.2010.5512754     Document Type: Conference Paper

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