Column Parity and Row Selection (CPRS): A BIST diagnosis technique for multiple errors in multiple scan chains

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 1109-1117

  Lin, Hung Mao ^a   Li, James C M ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COLUMN PARITY; DIAGNOSIS TECHNIQUES; SCAN CHAINS; SCAN CYCLE;

COSTS; ERROR CORRECTION; ERROR DETECTION; RANDOM PROCESSES;

BUILT-IN SELF TEST;

EID: 33847166867     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584078     Document Type: Conference Paper

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