Compressed pattern diagnosis for scan chain failures

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 744-751

  Huang, Yu ^a   Cheng, Wu Tung ^a   Rajski, Janusz ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATA COMPRESSION; EMBEDDED SYSTEMS; FAULT TOLERANT COMPUTER SYSTEMS; LOGIC DESIGN; PROGRAM DEBUGGING;

DIAGNOSIS ALGORITHMS; DIAGNOSIS RESOLUTION; FAULT DIAGNOSIS; TEST DATA;

PATTERN RECOGNITION;

EID: 33847149584     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584037     Document Type: Conference Paper

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