AFM diagnostics of graphene-based quantum Hall devices

Micron

Volumn 43, Issue 2-3, 2012, Pages 479-486

  Sikora, Andrzej ^a   Woszczyna, Mirosław ^b   Friedemann, Miriam ^b   Ahlers, Franz Josef ^b   Kalbac, Martin ^c  

^a ELECTROTECHNICAL INSTITUTE   (Poland)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c J HEYROVSKÝ INSTITUTE OF PHYSICAL CHEMISTRY   (Czech Republic)

Author keywords

Atomic force microscopy; Graphene; Kelvin probe force microscopy; Mechanical properties mapping; Quantum Hall effect devices

Indexed keywords

AFM; AFM IMAGING; ELECTRICAL PERFORMANCE; GRAPHENE SHEETS; IMAGING METHOD; KELVIN PROBE FORCE MICROSCOPY; KELVIN PROBE MICROSCOPY; LOCAL ELECTRIC FIELD; QUANTUM HALL DEVICES; QUANTUM HALL EFFECT; STRUCTURAL AND MECHANICAL PROPERTIES; TAPPING MODES; TIME-RESOLVED; WORKING CONDITIONS;

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ELECTRIC PROPERTIES; HALL EFFECT; HALL EFFECT DEVICES; MECHANICAL PROPERTIES; PROBES;

GRAPHENE;

EID: 84855241876     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.11.010     Document Type: Article

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