Mapping of mechanical properties of the surface by utilization of torsional oscillation of the cantilever in atomic force microscopy

Central European Journal of Physics

Volumn 9, Issue 2, 2011, Pages 372-379

  Sikora, Andrzej ^a   Bednarz, Lukasz ^a  

^a ELECTROTECHNICAL INSTITUTE   (Poland)

Author keywords

Atomic force microscopy; Mechanical properties mapping; Signal processing; Torsional oscillations

Indexed keywords

EID: 79951955864     PISSN: 18951082     EISSN: 16443608     Source Type: Journal    
DOI: 10.2478/s11534-010-0127-4     Document Type: Article

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