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Volumn 268, Issue 3-4, 2010, Pages 282-286

Determination of global and local residual stresses in SOFC by X-ray diffraction

Author keywords

Electrolyte; SOFC; Stress measurement; Synchrotron radiation; X ray diffraction

Indexed keywords

ANODE FUNCTIONAL LAYER; ANODE-SUPPORT; ANODE-SUPPORTED; AXIAL-COMPRESSIVE STRESS; CATHODE FUNCTIONAL LAYERS; CRYSTAL LATTICE DEFORMATION; DAMAGE EVOLUTION; DAMAGE MECHANISM; DEPTH PENETRATION; DIFFERENT SCALE; ELECTROCHEMICAL DEVICES; ELECTROLYTE LAYERS; FREE SURFACES; GRAZING INCIDENCE; HIGH OPERATING TEMPERATURE; HIGH-ACCURACY MEASUREMENTS; LOCAL STRESS; MACROSCOPIC STRESS; MECHANICAL INTEGRITY; MICROMETER SCALE; MONOCHROMATIC BEAM; ROOM TEMPERATURE; SINGLE CELLS; STRAIN TENSOR; SYNCHROTRON RADIATION X-RAY DIFFRACTIONS; X RAY MEASUREMENTS; X-RAY SYNCHROTRON RADIATION; X-RAY TECHNIQUES;

EID: 75849151921     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.09.017     Document Type: Article
Times cited : (38)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.