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Volumn 268, Issue 3-4, 2010, Pages 282-286
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Determination of global and local residual stresses in SOFC by X-ray diffraction
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Author keywords
Electrolyte; SOFC; Stress measurement; Synchrotron radiation; X ray diffraction
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Indexed keywords
ANODE FUNCTIONAL LAYER;
ANODE-SUPPORT;
ANODE-SUPPORTED;
AXIAL-COMPRESSIVE STRESS;
CATHODE FUNCTIONAL LAYERS;
CRYSTAL LATTICE DEFORMATION;
DAMAGE EVOLUTION;
DAMAGE MECHANISM;
DEPTH PENETRATION;
DIFFERENT SCALE;
ELECTROCHEMICAL DEVICES;
ELECTROLYTE LAYERS;
FREE SURFACES;
GRAZING INCIDENCE;
HIGH OPERATING TEMPERATURE;
HIGH-ACCURACY MEASUREMENTS;
LOCAL STRESS;
MACROSCOPIC STRESS;
MECHANICAL INTEGRITY;
MICROMETER SCALE;
MONOCHROMATIC BEAM;
ROOM TEMPERATURE;
SINGLE CELLS;
STRAIN TENSOR;
SYNCHROTRON RADIATION X-RAY DIFFRACTIONS;
X RAY MEASUREMENTS;
X-RAY SYNCHROTRON RADIATION;
X-RAY TECHNIQUES;
CERAMIC MATERIALS;
DEFORMATION;
DIFFRACTION;
ELECTROLYSIS;
ELECTROLYTES;
ENERGY CONVERSION;
FRACTURE MECHANICS;
MICROMETERS;
PHASE INTERFACES;
RESIDUAL STRESSES;
SOLID OXIDE FUEL CELLS (SOFC);
SYNCHROTRON RADIATION;
SYNCHROTRONS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
X RAYS;
STRESS MEASUREMENT;
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EID: 75849151921
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2009.09.017 Document Type: Article |
Times cited : (38)
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References (10)
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