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Journal of Analytical Atomic Spectrometry

Volumn 26, Issue 5, 2011, Pages 1051-1059

Coupling a wavelength dispersive spectrometer with a synchrotron-based X-ray microscope: A winning combination for micro-X-ray fluorescence and micro-XANES analyses of complex artistic materials

(7) Cotte, M a,b Szlachetko, J a,c Lahlil, S b Salome M a Sole V A a Biron, I b Susini, J a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE (France)

c JAN KOCHANOWSKI UNIVERSITY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM LINES; CULTURAL HERITAGE APPLICATION; CULTURAL HERITAGES; EMISSION LINES; FLUORESCENCE EMISSION; IN-SITU ANALYSIS; INVASIVENESS; MICRO SPECTROSCOPY; MICRO X-RAY FLUORESCENCE; MICRO-IMAGING; MICRO-XANES; MICRO-XRF; POLYCAPILLARIES; PORTABLE INSTRUMENT; SYNCHROTRON SOURCE; WAVELENGTH DISPERSIVE SPECTROMETERS; WAVELENGTH DISPERSIVE X-RAY SPECTROMETERS; WORKS OF ART; X RAY FLUORESCENCE; XRF ANALYSIS;

DISPERSION (WAVES); ELECTROMAGNETIC WAVE EMISSION; FLUORESCENCE; SPECTROMETERS; SPECTROMETRY; SYNCHROTRONS; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY MICROSCOPES; X RAYS;

X RAY ANALYSIS;

EID: 79955054351 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/c0ja00217h Document Type: Article

Times cited : (20)

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