A general Bayes weibull inference model for accelerated life testing

Reliability Engineering and System Safety

Volumn 90, Issue 2-3, 2005, Pages 140-147

  Rene Van Dorp J ^a   Mazzuchi, Thomas A ^a  

^a George Washington University   (United States)

Author keywords

Dirichlet distribution; Environmental testing; Step stress testing

Indexed keywords

ENVIRONMENTAL TESTING; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PROBABILITY; TRANSFER FUNCTIONS; VLSI CIRCUITS;

ACCELERATED LIFE TESTS (ALT); DIRICHLET DISTRIBUTIONS; STEP-STRESS TESTING; WEIBULL MODELS;

WEIBULL DISTRIBUTION;

EID: 21644447540     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2004.10.012     Document Type: Conference Paper

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