Commentary: The khamis/higgins model

IEEE Transactions on Reliability

Volumn 52, Issue 1, 2003, Pages 4-6

  Xu, Haiyan ^a   Tang, Yincai ^a  

^a SHANGHAI NORMAL UNIVERSITY   (China)

Author keywords

Cumulative exposure model; Khamis Higgins model; Step stress accelerated life test; Tampered failure rate model; Weibull distribution

Indexed keywords

FUNCTIONS; MATHEMATICAL MODELS; STATISTICAL METHODS; STRESSES;

CUMULATIVE EXPOSURE MODELS;

WEIBULL DISTRIBUTION;

EID: 0037333752     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2003.808472     Document Type: Article

References (8)

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