Planning step-stress accelerated life tests with two experimental variables

IEEE Transactions on Reliability

Volumn 56, Issue 3, 2007, Pages 569-579

  Xu, Hai Yan ^a   Fei, He Liang ^a  

^a SHANGHAI NORMAL UNIVERSITY   (China)

Author keywords

Design of experiments; Distribution; Log location scale; S optimality; Step stress

Indexed keywords

COMPUTER SIMULATION; DESIGN OF EXPERIMENTS; OPTIMIZATION;

EXPERIMENTAL VARIABLES; GUIDELINES; LOG-LOCATION-SCALE;

STRATEGIC PLANNING;

EID: 34548645051     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2007.903292     Document Type: Article

References (15)

1. A. A. Alhadeed and S. S. Yang, "Optimum simple step-stress plan for cumulative exposure model using log-normal distribution," IEEE Trans. Reliability, vol. 54, pp. 64-68, 2005.
2. C. A. Meeter and W. Q. Meeker, "Optimum accelerated life tests with a nonconstant scale parameter," Technometrics, vol. 36, pp. 71-83, 1994.
3. D. S. Bai and S. W. Chung, "Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring," IEEE Trans. Reliability, vol. 41, pp. 400-406, 1992.
4. D. S. Bai and M. S. Kim, "Optimum simple step-stress accelerated life tests for weibull distribution and type I censoring," Naval Research Logistics, vol. 40, pp. 193-210, 1993.
5. D. S. Bai, M. S. Kim, and S. H. Lee, "Optimum simple step-stress accelerated life tests with censoring," IEEE Trans. Reliability, vol. 38, pp. 528-532, 1989.
6. H. Chernoff, "Optimal accelerated life designs for estimation," Technometrics, vol. 4, pp. 381-408, 1962.
7. K. Chaloner and K. Larntz, "Bayesian design for accelerated life testing," Journal of Statistical Planning and Inference, vol. 33, pp. 245-259, 1995.
8. L. A. Escobar and W. Q. Meeker, "Planning accelerating life tests with two or more experimental factors," Technometrics, vol. 37, pp. 411-427, 1995.
9. L. C. Tang, T. N. Goh, Y. S. Sun, and H. L. Ong, "Planning accelerated life tests for censored two-parameter exponential distribution," Naval Res. Logistics, vol. 46, pp. 169-186, 1999.
10. W. B. Nelson, Accelerated Testing.: John Wiley & Sons, Inc, 1990.
11. W. B. Nelson, "A bibliography of accelerated test plan," IEEE Trans. Reliability, vol. 54, pp. 194-196, 2005, 370-373.
12. W. Q. Meeker, "A comparison of accelerated life test plans for weibull and lognormal distributions and type I censoring," Technometrics, vol. 26, pp. 157-171, 1984.
13. W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data. New York: John Wiley, 1999.
14. W. Q. Meeker and W. B. Nelson, "Optimum accelerated life-tests for the weibull and extreme value distributions," IEEE Trans. Reliability vol. 24, pp. 321-332, 1975.
15. R. Miller and W. B. Nelson, "Optimum simple step-stress plans for accelerated life Testing," IEEE Trans. Reliability, vol. 32, pp. 59-65, 1983.