A review of domain modelling and domain imaging techniques in ferroelectric crystals

Materials

Volumn 4, Issue 2, 2010, Pages 417-447

  Potnis, Prashant R ^a   Tsou, Nien Ti ^a   Huber, John E ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Characterization techniques; Microstructure; Single crystals ferroelectrics

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL MICROSTRUCTURE; FERROELECTRIC DEVICES; FERROELECTRIC FILMS; FERROELECTRICITY; FILMS; MICROSTRUCTURE; NEUTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

CHARACTERIZATION TECHNIQUES; DOMAIN MODELLING; DOMAIN PATTERN; DOMAIN STRUCTURE; FERROELECTRIC CRYSTAL; FERROELECTRIC DOMAIN STRUCTURE; PIEZOFORCE MICROSCOPY; X-RAY AND NEUTRON DIFFRACTION;

FERROELECTRIC MATERIALS;

EID: 80755164451     PISSN: None     EISSN: 19961944     Source Type: Journal    
DOI: 10.3390/ma4020417     Document Type: Article

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