Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

  Burnett, T L ^a   Weaver, P M ^a   Blackburn, J F ^a   Stewart, M ^a   Cain, M G ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINED TECHNIQUES; CRYSTALLOGRAPHIC ORIENTATIONS; DOMAIN ENGINEERING; DOMAIN SIZE; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACK-SCATTERED DIFFRACTION; FERROELECTRIC DOMAINS; FUNCTIONAL PROPERTIES; LEAD ZIRCONATE TITANATE; MULTIFERROICS; NANOACTUATORS; NANOSCALE CHARACTERIZATION; NANOSTRUCTURED FERROELECTRICS; PIEZOELECTRIC PROPERTY; PIEZOELECTRIC RESPONSE; PIEZORESPONSE FORCE MICROSCOPY; POLYCRYSTALLINE; QUANTITATIVE MEASUREMENT; STRUCTURAL GEOMETRY; TEXTURAL ANALYSIS; THIN FILM MATERIAL;

ELECTRON DIFFRACTION; FERROELECTRIC CERAMICS; LEAD; PIEZOELECTRICITY; SINGLE CRYSTALS; ZIRCONIUM;

FERROELECTRICITY;

EID: 77956335443     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3474940     Document Type: Conference Paper

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