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Volumn 48, Issue 6, 1999, Pages 717-723

A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls

(4) Foeth, M a Sfera, A a Stadelmann, P a Buffat, P A a

a EPFL (Switzerland)

Author keywords

Ferroelectric domain walls; High resolution electron microscopy; Image simulation; PbTiO3; Quantitative electron microscopy; Weak beam imaging

Indexed keywords

DOMAIN WALLS; FERROELECTRIC MATERIALS; FERROELECTRICITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAD TITANATE;

BEAM IMAGING; BEAM TRANSMISSION; FERROELECTRIC DOMAIN WALL; FERROELECTRIC DOMAINS; IMAGES SIMULATIONS; MEASUREMENTS OF; QUANTITATIVE ELECTRON MICROSCOPY; QUANTITATIVE MEASUREMENT; WEAK BEAM IMAGING; WEAK BEAMS;

ELECTRONS;

EID: 0033492455 PISSN: 00220744 EISSN: None Source Type: Journal
DOI: 10.1093/oxfordjournals.jmicro.a023740 Document Type: Conference Paper

Times cited : (56)

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