Mapping of domain structure in Barium Titanate single crystals by synchrotron x-ray topography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7644, Issue , 2010, Pages

  Potnis, Prashant R ^a   Huber, John E ^a   Sutter, John P ^b   Hofmann, Felix ^a   Abbey, Brian ^a   Korsunsky, Alexander M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

Barium titanate; Domain structure; Ferroelectrics; Single crystal; Synchrotron X ray diffraction; Topography

Indexed keywords

AFM; ANGULAR RESOLUTION; ANGULAR SEPARATION; COMPOSITE IMAGES; DOMAIN SPACING; DOMAIN STRUCTURE; ENGINEERED DOMAIN CONFIGURATIONS; ENHANCED PERFORMANCE; FERROELECTRIC SINGLE CRYSTALS; FINE MICROSTRUCTURE; FINE STRUCTURES; HIGH RESOLUTION; LARGE REGIONS; LATTICE ORIENTATIONS; LATTICE PLANE; ORTHOGONAL AXES; POLISHED SURFACES; SEM IMAGING; SYNCHROTRON X RAY DIFFRACTION; SYNCHROTRON X RAYS; TETRAGONAL CRYSTALS; TILT MEASUREMENT; UNPOLED CRYSTALS;

ATOMIC FORCE MICROSCOPY; BARIUM; BARIUM TITANATE; CAMERAS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; FERROELECTRIC MATERIALS; LIGHT REFLECTION; MECHANICS; SYNCHROTRON RADIATION; SYNCHROTRONS; TOPOGRAPHY; X RAY DIFFRACTION; X RAYS;

SINGLE CRYSTALS;

EID: 77953499343     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.845837     Document Type: Conference Paper

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