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Volumn 84, Issue 15, 2011, Pages

Intervalley coupling for interface-bound electrons in silicon: An effective mass study

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EID: 80455155977     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.155320     Document Type: Article
Times cited : (91)

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