Nano-scale current voltage characteristics of thin film solar cell with light irradiations

Current Applied Physics

Volumn 10, Issue SUPPL. 3, 2010, Pages

  Kawai, Masato ^a   Kawakami, Tomohiro ^a   Inaba, Tomoya ^a   Ohashi, Fumitaka ^a   Natsuhara, Hironori ^a   Itoh, Takashi ^a   Nonomura, Shuichi ^a  

^a GIFU UNIVERSITY   (Japan)

Author keywords

Conductive AFM; Nano scale I V characteristics; Surface topography; Thin film solar cell

Indexed keywords

AFM; CONDUCTIVE ATOMIC FORCE MICROSCOPES; CURRENT PATHS; CURRENT VOLTAGE; ELECTRICAL CONTACTS; HIGH IMPEDANCE; HYDROGEN PASSIVATION; HYDROGENATED AMORPHOUS SILICON (A-SI:H); IV CHARACTERISTICS; LARGE-GRAIN; LIGHT IRRADIATIONS; MEASUREMENT TECHNIQUES; NANO SCALE; NANO-METER SCALE; NC-SI:H; SCHOTTKY; SHORT-PATH; SI SOLAR CELLS; THIN FILM SOLAR CELLS; ZNO FILMS; ZNO THIN FILM;

AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; CONVERSION EFFICIENCY; GRAIN BOUNDARIES; IRRADIATION; METALLIC FILMS; NANOCANTILEVERS; NANOSTRUCTURED MATERIALS; PASSIVATION; SOLAR CELLS; SURFACE DEFECTS; SURFACE TOPOGRAPHY; THIN FILMS; TOPOGRAPHY; VAPOR DEPOSITION; ZINC OXIDE;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 77955511625     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2010.02.020     Document Type: Conference Paper

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