Automated in-situ optimization of bimorph mirrors at Diamond Light Source

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8139, Issue , 2011, Pages

  Sutter, John P ^a   Alcock, Simon G ^a   Sawhney, Kawal J S ^a  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

Bimorph; Ex situ; In situ; Mirror; Pencil beam; X ray

Indexed keywords

ACTIVE MIRRORS; AUTOMATED SCRIPTS; BIMORPH; BIMORPH MIRRORS; DIAMOND LIGHT SOURCE; EX SITU; HARD X-RAY MIRRORS; IN-SITU; OPTIMIZATION PROCEDURES; PENCIL BEAM; SLOPE ERRORS; SYNCHROTRON BEAMLINES;

ERRORS; LIGHT; LIGHT SOURCES; NUCLEAR INSTRUMENTATION; OPTICS; OPTIMIZATION; X RAYS;

MIRRORS;

EID: 80054054104     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.892719     Document Type: Conference Paper

References (21)

1. Sawhney, K. J. S., Alcock, S. G. and Signorato, R., "A novel adaptive bimorph focusing mirror and wavefront corrector with sub-nanometre dynamical figure control," Proc. SPIE 7803, 780303 (2010).
2. Hignette, O., Freund, A. & Chinchio, E., "Incoherent X-ray mirror surface metrology," Proc. SPIE 3152, 188-199 (1997).
3. Alcock, S. G., Sawhney, K. J. S., Scott, S., Pedersen, U., Walton, R., Siewert, F., Zeschke, T., Senf, F., Noll, T. and Lammert, H., "The Diamond NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability," Nucl. Instr. Meth. Phys. Res. A 616, 224-228 (2010).
4. Gougeon, S., Hignette, O., Freund, A. K., Lienert, U., Gondoin, P. and de Chambure, D., "Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility: part II," Proc. SPIE 2805, 90-107 (1996).
5. Yuan, S., Goldberg, K. A., Yashchuk, V. V., Celestre, R., McKinney, W. R., Morrison, G., Macdougall, J., Mochi, I. and Warwick, T., "Cross-check of ex-situ and in-situ metrology of a bendable temperature stabilized KB mirror," Nucl. Instrum. Meth. Phys. Res. A 635, S58-S63 (2011).
6. Susini, J., Labergerie, D. and Zhang, L., "Compact active/adaptive x-ray mirror: Bimorph piezoelectric flexible mirror," Rev. Sci. Instrum 66, 2229-2231 (1995).
7. Signorato, R., Hignette, O. and Goulon, J., "Multi-segmented piezoelectric mirrors as active/adaptive optics components," J. Synchrotron Rad. 5, 797-800 (1998).
8. Signorato, R. and Ishikawa, T., "R&D on third generation multi-segmented piezoelectric bimorph mirror substrates at Spring-8," Nucl. Instrum. Meth. Phys. Res. A 467-468, 271-274 (2001).
9. Takacs, P. Z., Church, E. L., Bresloff C. J., and Assoufid, L., "Improvements in the Accuracy and the Repeatability of Long Trace Profiler Measurements," Applied Optics 38, 5468-5479 (1999).
10. Siewert, F., Noll, T., Schlegel, T., Zeschke, T. and Lammert, H., "The nanometer optical component measuring machine: a new sub-nm topography measuring device for x-ray optics at BESSY," AIP Conf. Proc. 705, 847-850 (2004).
11. Geckeler, R. D., "ESAD shearing deflectometry: potentials for synchrotron beamline metrology," Proc. SPIE 6317, 63171H (2006).
12. Ziegler, E., Hignette, O., Morawe, Ch. and Tucoulou, R., "High-efficiency tunable X-ray focusing optics using mirrors and laterally-graded multilayers," Nucl. Instrum. Meth. Phys. Res. A 467-468, 954-957 (2001).
13. Hignette, O., Rostaing, G., Cloetens, P., Rommeveaux, A., Ludwig, W., and Freund, A. K., "Submicron focusing of hard x-rays with reflecting surfaces at the ESRF," Proc. SPIE 4499, 105-116 (2001).
14. Hignette, O., Peffen, J.-C., Alvaro, V., Chinchio, E. & Freund, A. K., "Towards the preparation of optical surfaces preserving the coherence of hard x-ray beams," Proc. SPIE 4501, 43-53 (2001).
15. Naulleau, P. P., Batson, P., Denham, P., Richardson, D., and Underwood, J., "An in situ scanning-slit alignment system for Kirkpatrick-Baez optics," Opt. Commun. 212, 225-233 (2002).
16. Flot, D., Mairs, T., Giraud, T., Guijarro, M., Lesourd, M., Rey, V., van Brussel, D., Morawe, C., Borel, C., Hignette, O., Chavanne, J., Nurizzo, D., McSweeney, S. & Mitchell, E., "The ID23-2 structural biology microfocus beamline at the ESRF," J. Synchrotron Rad. 17, 107-118 (2010).
17. Koch, A., Raven, C., Spanne, P. and Snigirev, A., "X-ray imaging with submicrometer resolution employing transparent luminescent screens," J. Opt. Soc. Am. A 15, 1940-1951 (1998).
18. Martin, T. and Koch, A., "Recent developments in X-ray imaging with micrometer spatial resolution," J. Synchrotron Rad. 13, 180-194 (2006).
19. Argonne National Laboratory, http://www.aps.anl.gov/epics/ (2010).
20. OpenGDA, http://www.opengda.org/OpenGDA.html, Diamond Light Source Ltd and STFC Daresbury Laboratory (2010).
21. Tucoulou, R., Martinez-Criado, G., Bleuet, P., Kieffer, I., Cloetens, P., Labouré, S., Martin, T., Guilloud, C. and Susini, J., "High-resolution angular beam stability monitoring at a nanofocusing beamline," J. Synchrotron Rad. 15, 392-398 (2008).