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Volumn 4499, Issue , 2001, Pages 105-116

Submicron focusing of hard X-rays with reflecting surfaces at the ESRF

Author keywords

Holotomography; Kirkpatrick Baez geometry; Microdiffraction; Microfluorescence; Microfocusing; X ray mirrors

Indexed keywords

DIFFRACTION; FLUORESCENCE; FOCUSING; MICROSCOPIC EXAMINATION; MIRRORS; OPTICAL MULTILAYERS; OPTIMIZATION; SUBSTRATES; WAVEFRONTS;

EID: 0035763342     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.450227     Document Type: Conference Paper
Times cited : (100)

References (10)
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  • 3
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    • Eng, P.1    Newville, M.2    Rivers, M.3    Sutton, S.R.4
  • 4
    • 0032367037 scopus 로고    scopus 로고
    • Design optimisation of a flexural hinge-based bender for x-ray optics
    • L. Zhang, O. Hignette, E. Ziegler and A.K. Freund, Design optimisation of a flexural hinge-based bender for x-ray optics, J. Synchrotron Radiation 5, 804-807 (1998)
    • (1998) J. Synchrotron Radiation , vol.5 , pp. 804-807
    • Zhang, L.1    Hignette, O.2    Ziegler, E.3    Freund, A.K.4
  • 5
    • 0034292577 scopus 로고    scopus 로고
    • Theory and practice of elliptically bent X-ray mirrors
    • M. Howells et al., Theory and practice of elliptically bent X-ray mirrors, Opt. Eng. 39(10), 2748-2762 (2000).
    • (2000) Opt. Eng. , vol.39 , Issue.10 , pp. 2748-2762
    • Howells, M.1
  • 6
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    • Design parameters for hard X-ray mirrors
    • J. Susini, Design parameters for hard X-ray mirrors Opt Eng. 34(2), 361-376 (1995)
    • (1995) Opt Eng. , vol.34 , Issue.2 , pp. 361-376
    • Susini, J.1
  • 8
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    • Towards the preparation of optical surfaces preserving the coherence of hard x-ray beams
    • these proceedings
    • O. Hignette, J.C. Peffen, A. Rommeveaux, V. Alvaro and A.K. Freund, Towards the preparation of optical surfaces preserving the coherence of hard x-ray beams, these proceedings.
    • Hignette, O.1    Peffen, J.C.2    Rommeveaux, A.3    Alvaro, V.4    Freund, A.K.5
  • 9
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    • Incoherent X-ray mirror surface metrology
    • O. Hignette, A.K. Freund and E. Chinchio, Incoherent X-ray mirror surface metrology, SPIE Proceedings 3152, 188-199 (1997).
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    • Hignette, O.1    Freund, A.K.2    Chinchio, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.